Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale - Archive ouverte HAL Access content directly
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Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale

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Dates and versions

hal-03956501 , version 1 (25-01-2023)

Identifiers

  • HAL Id : hal-03956501 , version 1

Cite

M.M. Saj Mohan, Antonio Da Costa, Jean-François Tahon, Vincent Bouad, Ahmad Hamieh, et al.. Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale. Matériaux Électroactifs et Applications (MatElec 2022), Jul 2022, Villeneuve d'Ascq, France. ⟨hal-03956501⟩
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